Digital radiology using active matrix readout of amorphous selenium: Radiation hardness of cadmium selenide thin film transistors


Journal article


Wei Zhao, David Waechter, J A Rowlands
Medical Physics, vol. 25, 1998, pp. 527-538

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Cite

APA   Click to copy
Zhao, W., Waechter, D., & Rowlands, J. A. (1998). Digital radiology using active matrix readout of amorphous selenium: Radiation hardness of cadmium selenide thin film transistors. Medical Physics, 25, 527–538.


Chicago/Turabian   Click to copy
Zhao, Wei, David Waechter, and J A Rowlands. “Digital Radiology Using Active Matrix Readout of Amorphous Selenium: Radiation Hardness of Cadmium Selenide Thin Film Transistors.” Medical Physics 25 (1998): 527–538.


MLA   Click to copy
Zhao, Wei, et al. “Digital Radiology Using Active Matrix Readout of Amorphous Selenium: Radiation Hardness of Cadmium Selenide Thin Film Transistors.” Medical Physics, vol. 25, 1998, pp. 527–38.


BibTeX   Click to copy

@article{zhao1998a,
  title = {Digital radiology using active matrix readout of amorphous selenium: Radiation hardness of cadmium selenide thin film transistors},
  year = {1998},
  journal = {Medical Physics},
  pages = {527-538},
  volume = {25},
  author = {Zhao, Wei and Waechter, David and Rowlands, J A}
}


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